Micromachines | Free Full-Text | Evaluation of Crystalline Volume Fraction of Laser-Annealed Polysilicon Thin Films Using Raman Spectroscopy and Spectroscopic Ellipsometry
Fast IR laser mapping ellipsometry for the study of functional organic thin films - Analyst (RSC Publishing) DOI:10.1039/C4AN01853B
Laser-Driven Light Sources for Ellipsometry
Ellipsometer
1: Schematic drawing of a null ellipsometer. A light source (a laser in... | Download Scientific Diagram
Smart SE - Powerful and cost-effective spectroscopic ellipsometer - HORIBA